Large area, high-accuracy dimensional metrology systems. The VIEW Summit systems are designed for components requiring a large work envelope and high accuracy. Based on the same core technologies of optics, high speed linear motors, and high resolution scales used in...
The VIEW MicroLine® is a high-performance critical dimensional measurement system designed to measure wafers, masks, MEMS and other micro-fabricated devices in situations which do not require fully automated operation. MicroLine systems feature the highest...
The all-new Precis® 200 incorporates the most advanced design and technology from VIEW Micro-Metrology. Based on the proven Innova wafer metrology system from Micro-Metric, the new Precis includes a number of configurable options that make the system more...
