VIEW | MSI - Metrology Solutions Inc. https://msimeasure.allanhawkins.net Quality Measurements for all Facets of Industry Tue, 03 Apr 2018 19:21:30 +0000 en-US hourly 1 https://wordpress.org/?v=6.7.2 Benchmark 250 https://msimeasure.allanhawkins.net/benchmark-250/ Thu, 12 Jan 2017 23:46:37 +0000 http://msimeasure.com/?p=857

A compact, high-accuracy dimensional metrology system.

The VIEW Benchmark™ 250 is engineered for high accuracy in a compact benchtop configuration complete with VIEW’s dual magnification optics and metrology-grade construction.

The Benchmark 250 is designed for use on the production floor to provide precision measurements for process control. Its compact size and powerful software make the Benchmark 250 a versatile measurement system that can be easily configured as either a dedicated gauge for critical dimension measurements or as a general purpose vision measurement system for routine quality monitoring.

 

Key Features and Options

 

The Benchmark 250 is well suited to measure many types of components, including molded plastic parts, machined parts, electronic assemblies, semiconductor packages, fiber optic components, disk media substrates, recording head dies, or semiconductor wafers up to 150 mm in diameter.

]]> Benchmark 450 https://msimeasure.allanhawkins.net/benchmark-450/ Thu, 12 Jan 2017 23:39:17 +0000 http://msimeasure.com/?p=854

High-value, high-accuracy dimensional metrology system.

The VIEW Benchmark™ 450 delivers VIEW performance with generous measuring envelopes. Benchmark 450 embodies the ideal configuration of SMT assembly metrology when configured with VIEW’s unique Elements software.

The Benchmark 450 handles large form-factor parts with high precision in a rugged, shop-floor configuration with a small footprint. Its fixed bridge design separates the X and Y axis motions, allowing each to operate without any influence on the other. This arrangement provides the maximum mechanical integrity and accuracy in the stage motion.

 

Key Features and Options

 

Dual magnification optics and an optional through-the-lens (TTL) laser sensor make the Benchmark an ideal system for many applications including molded plastic parts, screen printer stencils, printed circuit boards, solder paste, epoxy glue dots, precision machined parts, and many others.

]]> Benchmark 624 https://msimeasure.allanhawkins.net/benchmark-624/ Thu, 12 Jan 2017 23:29:40 +0000 http://msimeasure.com/?p=851

Large transport, 3-axis measurement system.

The VIEW Benchmark™ 624 is a large capacity, fully automatic, 3-axis dimensional measuring system. The Benchmark 624’s moving bridge design creates an open work envelope for easy access to the measurement area and allows the part being measured to remain stationary at all times.

With its massive granite base and high precision fixed lens optical system, the Benchmark 624 provides the accuracy and reliability that you expect from a world-class metrology system.

]]> Benchmark XLT https://msimeasure.allanhawkins.net/benchmark-xlt/ Thu, 12 Jan 2017 23:25:03 +0000 http://msimeasure.com/?p=847

Extra large area dimensional metrology system.

The VIEW Benchmark™ XLT delivers VIEW performance and reliability in a large travel, non-contact, high precision metrology system.

The Benchmark XLT is designed to handle large area parts or nested groups of smaller parts using its moving bridge design. Advanced image processing allows the Benchmark XLT to operate with high speed, accuracy and robustness.

 

Key Features and Options:

 

The XLT offers extended travel ranging from 900 mm x 1500 mm to 1500 mm x 2000 mm to handle large area parts or nested groups of smaller parts. The XLT’s moving bridge design features an open work envelope for loading and unloading large parts.

Advanced optics, illumination, and image processing make the Benchmark XLT a world-class metrology system.

]]> Pinnacle 250 https://msimeasure.allanhawkins.net/pinnacle-250/ Thu, 12 Jan 2017 23:12:09 +0000 http://msimeasure.com/?p=844

The Pinnacle 250 offers the highest accuracy and fastest speeds of the VIEW Micro-Metrology line. Its high performance and compact footprint make it VIEW Micro-Metrology’s most popular model.

The Pinnacle features a damped granite base and column, with passive vibration isolation. A precision compound X-Y stage with high-speed linear motor drives provides velocity of 400 mm / sec and acceleration of 1000 mm / sec2. This combination of high acceleration and high velocity enables the high throughput required for near-line process monitoring. The rugged and compact design of the Pinnacle lends itself to installation in either a Q/A lab or at an inspection station in the manufacturing line.

 

Key Features and Options

 

The Pinnacle is ideal for measurement of small, close tolerance parts, particularly parts with a high density of features, such as hard disk drive suspensions, printer heads, precision stampings, leadframes, ball-grid arrays, and chip scale packages.

The Pinnacle can be equipped with an optional through-the-lens or offset mounted laser for added flexibility in Z-axis measurements. Pinnacle models can also utilize the optional SpectraProbe™ offering sub-micron Z-axis measurement resolution.

The Pinnacle operates with one or more of VIEW Micro-Metrology’s standard metrology software packages:

  • VIEW Metrology Software (VMS™) which offers a wide array of standard measurement tools as well as a built-in scripting language to enable custom-functions.
  • Elements® CAD-to-Measure software provides automatic translation of 2-D CAD files in measurement programs, enabling very fast set-up of measurement routines for even the most complex parts.
]]> Pinnacle Plus https://msimeasure.allanhawkins.net/pinnacle-plus/ Thu, 12 Jan 2017 22:49:45 +0000 http://msimeasure.com/?p=841

Ultra-high accuracy dimensional metrology system.

Pinnacle+ Plus elevates Pinnacle performance to the next level. Pinnacle+ Plus features a rigid granite optical support structure and a high performance Z-axis motion assembly to produce the lowest possible uncertainty on micro-electronic parts and assemblies/

State-of-the-art linear motion control technology provides the fastest, most reliable platform available for high capacity operation in production environments ranging from clean rooms to factory floors.

 

Key Features and Options

Pinnacle+ Plus’ state-of-the-art linear motion control technology provides the fastest, most reliable platform available for high volume, high capacity operation in production environments ranging from clean rooms to factory floors.

The Pinnacle+ Plus operates with one or more of VIEW Micro-Metrology’s standard metrology software packages:

  • VIEW Metrology Software (VMS™) is standard on Pinnacle+ Plus and offers a wide array of standard measurement tools as well as a built-in scripting language to enable custom-functions.
  • Elements® CAD-to-Measure software is optional on Pinnacle+ Plus and provides automatic translation of 2-D CAD files in measurement programs, enabling very fast set-up of measurement routines for even the most complex parts.
  • Measure-X® metrology software is optional on Pinnacle+ Plus, guiding users through measurement routines with its intuitive point and click interfaces.
]]> Summit 600/800 https://msimeasure.allanhawkins.net/summit-600800/ Thu, 12 Jan 2017 22:42:22 +0000 http://msimeasure.com/?p=837

Large area, high-accuracy dimensional metrology systems.

The VIEW Summit systems are designed for components requiring a large work envelope and high accuracy. Based on the same core technologies of optics, high speed linear motors, and high resolution scales used in the VIEW Pinnacle, the Summit features a fixed bridge design. Separate X and Y axis motion systems ensure that neither influences the mechanical integrity of the other, while also enabling easy loading and unloading of large parts.

Available in three ranges of travel, the VIEW Summit is ideally suited to for measurement of large footprint parts, such as PCBs, stencils, flat panel displays, etching sheets and mark patterns, or nested groups of smaller parts. The Summit provides very high accuracy and high speed for shop floor process monitoring and quality assurance applications.

 

Key Features and Options:

 

The Summit systems are ideal for measurement of large format parts requiring high accuracy, such as solder paste stencils and screens, artwork, panelized printed circuit boards, flex circuits, and micro-etched parts.

Summit models can be equipped with an optional through-the-lens or offset mounted laser for added flexibility in Z-axis measurements. Summit models can also utilize the optional SpectraProbe™ offering sub-micron Z-axis measurement resolution.

]]> MicroLine Series https://msimeasure.allanhawkins.net/microline-series/ Thu, 12 Jan 2017 22:37:12 +0000 http://msimeasure.com/?p=834

The VIEW MicroLine® is a high-performance critical dimensional measurement system designed to measure wafers, masks, MEMS and other micro-fabricated devices in situations which do not require fully automated operation.

MicroLine systems feature the highest quality microscope optics, manually operated stages and programmable light intensity. MicroLine systems are robust and capable of measuring transparent layers, lines with irregular edge and other critical features.

 

Specifications

  Standard Optional
X,Y,Z Measuring Range (mm) 200×200 300×300
Z Focusing Range (mm) 25
XY Stage Cross roller with manual coaxial positioning and quick release Glass stage insert for use with transmitted light
Imaging Optics Olympus Microscope optics, including horizontal bright field/dark field illuminator, five-objective motorized lens turret, tilt trinocular with eyepieces, and standard camera mounting tube
Front Lens (Field Interchangable) 10X Bright Field
50X Bright Field		 5X Bright Field or Bright Field/Dark Field
10X Bright Field or Bright Field/Dark Field
20X Long Working Distance, Bright Field or Bright Field/Dark Field
100X Long Working Distance, Bright Field or Bright Field/Dark Field
150X Long Working Distance, Bright Field or Bright Field/Dark Field
Illumination Full spectrum, programmable tungsten halogen coaxial surface light Full spectrum, programmable tungsten halogen transmitted light with adjustable N.A. stop
]]> Precis 200 https://msimeasure.allanhawkins.net/precis-200/ Wed, 11 Jan 2017 22:36:59 +0000 http://msimeasure.com/?p=825

The all-new Precis® 200 incorporates the most advanced design and technology from VIEW Micro-Metrology. Based on the proven Innova wafer metrology system from Micro-Metric, the new Precis includes a number of configurable options that make the system more versatile, serviceable and reliable:

  • Extended Z-axis range – 2.5mm, 5mm or 100mm
  • Transmitted illumination
  • Integral electronics drawer – fully compliant with SEMI S2 and CE standards
  • Ergonomic operator control station with hide-away keyboard tray, adjustable height and angle for control panel and display monitor, SEMI S8 compliant
  • Fully automated microscope with all settings computer controlled
  • Megapixel camera for optimum resolution
  • VIEW Metrology Software (VMS™) allows a wide range of components to be measured, with the option of CAD translation and full geometric dimensioning and tolerancing.
  • MMWin – wafer and mask metrology software – ideal for critical dimension and overlay registration measurement for wafers, slider ABS, photomask and flat panel displays.
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